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X-ray non-destructive testing system EFPscan-2000

X-ray non-destructive testing system EFPscan-2000

X-ray non-destructive testing system EFPscan-2000

About


EFPscan-2000 is suitable for high-resolution and fast 3D tomography detection of large-area plate samples

EFPscan-2000 is a 3D X-ray testing system for PCBA and IGBT field. It adopts advanced Computed Laminography (CL) scanning mode and reconstruction algorithm and can be used off-line and on-line to test the whole plate. It is suitable for testing electronic devices such as BGA/LGA, pressfit connector, Flip chip, PoP, QFN, PTH and IGBT to find defects such as pores, open circuits, bridging, head-in-pillow, poor wetting, missing parts, and wrong parts inside the device.

●Fastest CT imaging of a FOV area completed in 5 seconds
●Integrity and high resolution for large-sided plate sample
●Programmable scanning process to simplify the workload of operators
●Dedicated automatic identification algorithm to quantitatively count the defects inside the device



PARAMETERS

Parameter Name Parameter Value
Options
X-ray