"ThermalViewX MCR series" is a thermography that can measure microscopic areas where thermocouples cannot be available to measure temperature. It can measure temperatures up to 400 Celsius degree and more as option at the micron level. It has been introduced to many national and public research institutes, universities, and industrial companies. It is used in semiconductor-related, carbon neutral, and green energy-related fields.

Parameter Name	Parameter Value
Applications	for the semiconductor industry
Function	thermographic measuring
Spectrum	infrared
Sensor	FPA
Other characteristics	high-sensitivity high-speed high-performance high-end cooled