AS5900 CT Detector Interface
128-channel low noise current-to-digital converter

Features
Flexible configuration to get the optimized operation point in your application
Adjustable full scale range, resolution, integration time and power consumption
High speed LVDS data interface
On board voltage reference and temperature sensor

Benefits
Ultra-low noise down to 3200 electrons for a full-scale range up to 1µA
Very fast integration time down to 50µs
High linearity of ±250ppm of reading ±1ppm of FSR
Very low power dissipation down to 1mW/channel
Up to 26-bit resolution

Product parameters
Application: Medical, industrial and security X-ray scanner
Primary Function: Current-to-digital Converter
Channels: 128-channel
Resolution [bit]: 26
Input Related Noise [fC]: 0.51
Min. Power Consumption [mW per Channel]: 1
Min. Integration Time [µs]: 50
Package: FBGA248 (10mm x 10mm)

General Description
The AS5900 device is a low noise, 128-channel current-to-digital converter that enables the readout of the photodiodes with highest sensitivity. High-resolution CT imaging can be achieved up to 26-bits resolution. Its 128-low-noise and high linear converter channels provide an increased gray scale, improved contrast and reduce artifacts of 3D CT images. The low power consumption of 1mW per channel reduces self-heating effects and the overall power consumption of the system. An integrated temperature sensor allows the calibration of temperature drifts of the X-ray detector modules.

Parameter Name	Parameter Value
Type	power digital temperature speed
Other characteristics	industrial fast multi-channel